Enhancement of Piezoelectric Surface‐Wave Coupling by Thin‐Film Perturbation
作者： T. M. Reeder , G. S. Kino , P. L. Adams
DOI: 10.1063/1.1653917
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摘要: Experimental measurements of interdigital transducer input impedance are used to demonstrate that the coupling constant for piezoelectric surface waves can be enhanced by use an appropriate thickness dielectric overlay film. Measurements SiO2/YZ lithium niobate configuration described and compared with exact calculation a qualitative perturbation analysis.
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