Determination of Surface-Film Thickness from Shift of Optically Excited Surface Plasma Resonance

作者: J. L. Stanford

DOI: 10.1364/JOSA.60.000049

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摘要: The strong coupling between photons and surface plasmons that occur on rough metal surfaces permits optical measurements of the shift plasma resonance frequency when is covered with a thin film. Thin, discontinuous silver sulfide tarnish films to lower frequencies also damp resonance, in agreement plasmon dispersion theory. wavelength dominant wave large compared size discontinuities, so effect film should be same as continuous whose thickness average On this basis, thicknesses several are calculated from measured peak found excellent values determined independent ellipsometric measurements.

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