Micromechanical atomic force sensor head

作者: Johann Greschner , Wolfgang D. Pohl , Urs T. Duerig , James K. Gimzewski , Olaf Wolter

DOI:

关键词:

摘要: ABSTRACT The micromechanical sensor head is designed to measure forces down 10-13 N. It comprises a common base from which cantilever beam and member extend in parallel. carries sharply pointed tip of hard material, dielectric or not, for interaction with the surface sample be investigated. Bulges forming tunneling junction protrude facing surfaces said beams, gap between bulges being adjustable by means electrostatic generated potential (Vd) applied pair electrodes respectively coated onto parallel beams. consists one single piece semiconductor such as silicon gallium arsenide (or any other compounds thereof) fabricated dimensions required application conventional chip manufacturing techniques.

参考文章(5)
Heinrich Rohrer, Gerd Binnig, Scanning tunneling microscope ,(1980)
Heinrich Dr. Rohrer, Hermann Nievergelt, Gerd Dr. Binnig, Edmund Weibel, Electric travelling support ,(1981)
Wolfgang Dieter Dr. Pohl, James Kazimierz Dr. Gimzewski, Scanning tunneling microscope ,(1985)
G. Binnig, C. F. Quate, Ch. Gerber, Atomic force microscope Physical Review Letters. ,vol. 56, pp. 930- 933 ,(1986) , 10.1103/PHYSREVLETT.56.930