作者: JH Yin , J Ding , JS Chen , XS Miao , None
DOI: 10.1016/J.JMMM.2006.01.061
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摘要: Abstract Co-ferrite thin films on (1 0 0) SiO 2 substrates were deposited using pulsed laser deposition with in situ heating and post-annealing heat treatments. The structure magnetic properties of the analyzed by X-ray diffractionmetry, atomic force microscopy, transmission electron Raman spectroscopy alternating gradient magnetometry. High perpendicular coercivity around 8.9 kOe has been obtained film substrate at 700 °C. was found to be related nanocystalline grain size, large lattice strain, surface roughness preferential texture structure.