作者: R. Siuda
DOI: 10.1016/S0167-2991(08)65083-1
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摘要: Publisher Summary The process of the changes shape Auger lines—during compositional analysis surfaces or interfaces—offers a valuable possibility to inquire into electronic structure material under study. However, if subject interest is only, then variability line undesirable as it affects peak-to-peak (PPH) intensity line. PPH extremely sensitive (width) variations, and therefore, accurate requires careful checking constancy width. If width slightly accuracy can be expected better all spectra, including those for standards, are taken with intentionally deteriorated resolution. In this chapter, numerical evaluation distortions because have been performed two cases most commonly met in practical AES. widely used practice elemental electron spectroscopy (AES) determination concentrations elements given sample by comparing transition from pure element. During solid composed substance, has shown that variation small 5–10% may cause change order typical corrections matrix effects; especially γ≤1—that is, lines recorded relatively high