Optical monitoring of nonquarterwave stacks.

作者: C. J. van der Laan

DOI: 10.1364/AO.25.000753

关键词:

摘要: The planning of an optical monitoring process for nonquarterwave stacks, using standard equipment turning value monitoring, is a rather complicated procedure. It shown that by computer program together with some simple rules the becomes more straightforward task. Detailed examples are presented.

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