作者: Michael Hutter , Jörn-Marc Schmidt , Thomas Plos
DOI: 10.1007/978-3-540-85053-3_23
关键词:
摘要: Radio Frequency Identification (RFID) is a rapidly upcoming technology that has become more and important also in security-related applications. In this article, we discuss the impact of faults on kind devices. We have analyzed conventional passive RFID tags from different vendors operating High (HF) Ultra-High (UHF) band. First, consider been enforced globally affecting entire chip. induced caused by temporarily antenna tearing, electromagnetic interferences, optical inductions. Second, locally using focused laser beam. Our experiments led us to result are exceedingly vulnerable during writing data stored into internal memory. show it possible prevent as well allow faulty values. both cases, confirm operation be successful. conclude fault analysis poses serious threat context considered if cryptographic primitives embedded low-cost tags.