Load card for testing peripheral component interconnect slots

作者: Bo Tian , Ze-Yun Wu , Chao-Ke Wei

DOI:

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摘要: A load card for testing different types of PCI slots is provided. The includes several gold fingers, and resistor selection circuits. Each finger corresponds to one slot. circuit a test at least slot working in voltage. When voltage be tested, the connects slot, including enabled others are disabled response an operation user.

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