Lsi test board

摘要: PROBLEM TO BE SOLVED: To reduce the switching/creation time for an LSI test board by performing switching with a conversion contact pin only, when kind in same package. SOLUTION: A is composed of general purpose upper part 1, 2, and lower 3. The 1 connected to semiconductor device 8 be tested. 2 installed so that it can electrically between made each kind. 3 tester 7. In order switch different arrangement package, other have only exchanged, other. COPYRIGHT: (C)1998,JPO