Diffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronics

作者: Matt Mathews Pharr , None

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摘要: … behavior of microelectronic devices and lithium-ion batteries. … of high-capacity lithium-ion batteries, which demonstrate … of lithiated silicon, finding it to be similar to that of pure silicon …

参考文章(186)
C. P. Chen, M. H. Leipold, Fracture toughness of silicon ,(1980)
Huixin Chen, Ying Xiao, Lin Wang, Yong Yang, Silicon nanowires coated with copper layer as anode materials for lithium-ion batteries Journal of Power Sources. ,vol. 196, pp. 6657- 6662 ,(2011) , 10.1016/J.JPOWSOUR.2010.12.075
John Freserick Nye, Physical properties of crystals ,(1985)
J.W. Hutchinson, Z. Suo, Mixed mode cracking in layered materials Advances in Applied Mechanics. ,vol. 29, pp. 63- 191 ,(1991) , 10.1016/S0065-2156(08)70164-9
L B Sills, T J Chuang, K I Kagawa, J R Rice, Non-equilibrium models for diffusive cavitation of grain interfaces Perspectives in Creep Fracture. pp. 87- 106 ,(1978) , 10.2172/6796957
R Ballarini, H Kahn, N Tayebi, AH Heuer, Effects of Microstructure on the Strength and Fracture Toughness of Polysilicon: A Wafer Level Testing Approach Mechanical Properties of Structural Films. pp. 37- 51 ,(2001) , 10.1520/STP10979S
Juchuan Li, Xingcheng Xiao, Fuqian Yang, Mark W. Verbrugge, Yang-Tse Cheng, Potentiostatic Intermittent Titration Technique for Electrodes Governed by Diffusion and Interfacial Reaction Journal of Physical Chemistry C. ,vol. 116, pp. 357- 357 ,(2012) , 10.1021/JP207919Q
Ying-Chao Hsu, Chung-Kwuang Chou, P. C. Liu, Chih Chen, D. J. Yao, T. Chou, K. N. Tu, Electromigration in Pb-free SnAg3.8Cu0.7 solder stripes Journal of Applied Physics. ,vol. 98, pp. 033523- ,(2005) , 10.1063/1.1999836