Spectroscopic Analyses of Surfaces and Thin Films

摘要: The first methods devoted to the characterization of surfaces and investigation their properties were developed as early in 19th century. Although mostly phenomenologic they used physical which are among most important understand evolution crystal growth. One can think, for example, Brunauer-Emmet-Teller (BET) method, based on physisorption rare gases at low temperature correctly described by Langmuir, surface-angle measurements that depend surface tension materials rely equations derived Young, using Gibbs approach thermodynamics surfaces. These two (sorption tension) well known be critical thin film deposition modificaton. This explains perhaps why these still widely science, especially industry-related laboratories. However, nowadays scientists elasborators prefer spectroscopies chemical diffraction structural properties. In Chapter 13 , will dealt throughly we shall focus here spectroscopic indeed go much farther than characterization. has think cannot separated so strictly. There deep relationships between one other.