Sensitive photothermal deflection technique for measuring absorption in optically thin media
作者： A. C. Boccara , Warren Jackson , Nabil M. Amer , D. Fournier
DOI: 10.1364/OL.5.000377
关键词:
摘要: A highly sensitive and simple photothermal scheme for determining optical absorptions in condensed-matter samples is presented. αl values as low as 10^−7 and 10^−8 were …
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