Resonant Soft X-ray Scattering of Polymers with a 2D Detector: Initial Results and System Developments at the Advanced Light Source
作者： C Wang , A Hexemer , J Nasiatka , E R Chan , A T Young
DOI: 10.1088/1757-899X/14/1/012016
关键词:
摘要: Most advanced applications of polymers rely on heterogeneous structures or specific interfacial properties to yield desired performance and functionalities. Rational design application require that these be characterized. Recently, it has been demonstrated soft x-ray scattering is a unique complementary technique conventional hard neutron an excellent tool for polymer structure determination with improved chemical sensitivity. Efforts enhance the capabilities efficiency through use CCD detector will delineated first results presented. Development dedicated setup at beamline 11.0.1.2 Advanced Light Source described. This set-up elliptically polarized undulator as source, which offers complete polarization control hence capabilities.
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