Light-Induced Charge Carrier Dynamics at Nanostructured Interfaces Investigated by Ultrafast Electron Diffractive Photovoltammetry

摘要: We present an ultrafast photovoltammetry framework to investigate the surface charge carrier dynamics at nanometer scale. This diffraction-based method utilizes feature-gated nanomaterial diffraction pattern identify scattering sites and deduce associated from nanocrystallographic refraction-shift observed in electron patterns. From applying this methodology on SiO2/Si interface, surfaces decorated with nanoparticles water–ice adsorbed layer, we are able elucidate localized injection, dielectric relaxation, diffusion, direct resolution state possibly correlated structural these interfaces, which central nanoelectronics, photovoltaics, photocatalysis development. These new results highlight high sensitivity of interfacial transfer nanoscale modification, environment, plasmonics enhancement demonstrate voltage probe as a unique powerful resolve scale dynamics.