Dielectric relaxation and conduction mechanism in LaNi3/4M1/4O3 (M = Mo, W) at low temperature

作者: Alo Dutta , T.P. Sinha

DOI: 10.1016/J.JALLCOM.2010.10.012

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摘要: Abstract In order to investigate the electrical transport in LaNi 3/4 Mo 1/4 O 3 and W , dc conductivity dielectric properties these polycrystalline materials are investigated temperature range from 163 K 383 K frequency 50 Hz 1 MHz. The X-ray diffraction patterns of samples show monoclinic phase at room temperature. homogeneity is determined by energy dispersive analysis (EDAX) attached with a scanning electron microscope. dependence shows semiconducting nature materials. complex impedance plane plots that relaxation (conduction) mechanism purely bulk effect arising semiconductive grains. frequency-dependent data also analyzed framework ac formalism. spectra follow universal power law. activation energies required for conduction 0.143 0.165 eV LNM LNW respectively. scaling behaviour loss tangent suggests describes same various temperatures.

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