作者: L. Qian , J. Mei , J. Liang , X. Wu
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摘要: AbstractA finite element model has been established and used to predict the temperature history of direct laser fabricated (DLFed) Ti–6Al–4V thin wall samples. The effects power effect location within a sample on its have modelled compared with temperatures measured during DLF using thermocouples. thermal material correlated observed differences in microstructures obtained at different locations given or for samples powers.