Diffractographic dimensional measurement. Part 1: displacement measurement.

摘要: This is the first of a two-part paper on measurement displacement and profile using changes in far-field diffraction patterns slit aperture formed between test reference object. When applied to method very accurate over considerable range, noncontacting, linear, easy use. In addition considerations involved this diffractographic technique, three unique applications are discussed. These are: simultaneous deflection along line, surface relative an edge, vibration amplitude time-averaged fringes.