A Numerical Study of a Model Near-Field Optical Microscope

摘要: We study a two-dimensional model of the scattering p- and s-polarized light, emitted by coated tapered glass fiber, from metal surface with topographic or an optical defect. calculate intensity scattered electromagnetic field at center bottom integrated back through as it is moved constant height above perturbed surface. The position width defects can be determined these calculations subwavelength resolution, although intensities bear no simple relation to scanned.