Material uniformity of CdZnTe grown by low-pressure bridgman
作者： C.M. Greaves , B.A. Brunett , J.M. Van Scyoc , T.E. Schlesinger , R.B. James
DOI: 10.1016/S0168-9002(00)00855-X
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摘要: Abstract We have employed Low-Temperature Photoluminescence (LTPL) and Room-Temperature Mapping (RTPLM) to explore the crystalline quality material uniformity of Cadmium Zinc Telluride (CZT) radiation detector grown by Low-Pressure Bridgman (LPB) technique. report on differences in supplied eV Products Inc. IMARAD Imaging Systems Ltd. In addition, we examined general response IMARAD. temperature dependence this when used as a detector.
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