作者: K.L Narayanan , K.P Vijayakumar , K.G.M Nair , B Sundarakkannan , R Kesavamoorthy
DOI: 10.1016/S0168-583X(99)00602-3
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摘要: CdS thin films prepared by vacuum evaporation method were implanted with oxygen ions at the energy of 80 keV to different doses. Raman scattering studies as-deposited and reveal shift in peak position A1(LO) mode towards higher wave number on implantation. The area under increases dose initially, then decreases numbers has been attributed replacement sulphur atoms lighter atoms.