Circuit test system electric element memory control chip under different test modes
作者： Wen-Chang Cheng
DOI:
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摘要: A circuit test system including a apparatus and to be tested is provided. The provides first clock signal. includes plurality of input/output pads at least one pad. At two the are connected each other form loop during mode. pad receives multiplies frequency signal generate second signal, based on higher than that Furthermore, method foregoing also
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