The Application of a Soft X-Ray Spectrometer to Study the Oxygen and Fluorine Emission Lines from Oxides and Fluorides

作者: R. A. Mattson , R. C. Ehlert

DOI: 10.1007/978-1-4684-7633-0_42

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摘要: Results are shown for O and F K emission lines from several oxide fluoride compounds. The spectra examined both structure wavelength. Excitation of the is by electrons X-rays. oxygen- fluorine-bearing gases influence composition diffracting crystal on shape observed oxygen also discussed. Curved crystals potassium acid phthalate lead stearate, a thin-window flow proportional counter, used to obtain results.

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