The submillimetre dielectric response of a PLZT 9.5/65/35 relaxor thin film

摘要: We report on the first quantitative evaluation of soft-mode behaviour relaxor PLZT 9.5/65/35. The transmission spectra a thin film deposited sapphire substrate were measured in region at temperatures from 300 up to 523 K, and range 8 - K. fitted using model classical oscillators, calculated parameters observed lattice modes. results compared with those for bulk ceramics, satisfactory agreement was achieved. soft mode is heavily damped, below room temperature it shows strong hardening cooling. Above temperature, its eigenfrequency levels off, but corresponding dielectric loss maximum continues soften weakly down where becomes overdamped. lower-frequency data require an additional relaxation range. Comparison all available points polydispersive losses Hz range, another dispersion lower frequencies. assign them fluctuations polar nanocluster volume, reorientations cluster polarization, respectively. Their contribution low-frequency permittivity much stronger than that mode.