Plasma etching of semiconductor substrates

作者: Stephen P. Rogers , Michael S. Lebby

DOI:

关键词:

摘要: A method for plasma etching semiconductor materials using silicon tetrachloride and boron trichloride is provided. Less etch damage, a greater degree of anisotropy more controlled provided by exposing III-V compound to the novel gas mixture.

参考文章(7)
Takumi Tandou, Hiroyuki Kobayashi, Shoichi Nakashima, Naoshi Itabashi, Plasma treatment apparatus ,(1988)
Richard F. Landau, Henry A. Majewski, Method of inhibiting corrosion after aluminum etching ,(1984)
Cecil J. Davis, Rudy L. York, Patricia B. Smith, Joseph D. Luttmer, Method for passivating wafer ,(1988)
Fujikawa Michio, REACTIVE ION ETCHING PROCESS ,(1988)
Sagawa Seiji, DRY ETCHING METHOD ,(1988)