Highly Accelerated Life Testing of Embedded Planar Capacitors With Epoxy- ${\rm BaTiO}_{3}$ Nanocomposite Dielectric
作者： Mohammed A Alam , Michael H Azarian , Michael G Pecht , None
DOI: 10.1109/TCPMT.2012.2204994
关键词:
摘要: Highly accelerated life testing (HALT) was performed on embedded planar capacitors by subjecting these devices to elevated temperature and voltage aging conditions. The dielectric material of a nanocomposite epoxy BaTiO3. objective HALT model the time-to-failure as function using Prokopowicz model. This involved computing constants model, exponent (n), activation energy (Ea) for results can be used qualification further improvement in manufacturing processes capacitors.
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