Interface Apparatus for Semiconductor Testing and Method of Manufacturing Same
作者： Kothandan Shanmugam , Christine Bui , Lim Hooi Weng , Hai Dau
DOI:
关键词:
摘要: In one embodiment, the present invention includes an interface apparatus for semiconductor testing. The a housing. housing lower substrate and upper substrate. has plurality of apertures arranged according to fine pitch, coarse pitch. A wires passes through from Each wire plated conductive ends emanating opposing sides corresponds transforms pattern having course pitch
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