Gaussian-beam mode analysis of reflection and transmission in multilayer dielectrics

摘要: The analysis of reflections from thin films or dielectric materials can be approached by a matrix method that treats any thin-layer device as cascade sequential, zero-thickness reflecting surfaces [J. Opt. Soc. Am. A2, 1363 (1985)]. Our paper presents an alternative for predicting the reflection/transmission characteristics such in Fabry-Perot interferometer configuration based on Gaussian-beam modal within scattering-matrix framework [in Proceedings IEE 7th International Conference Antennas and Propagation (IEE, 1991), Issue 15, p. 201.] We present validate scalar approach using long-wavelength examples, where diffraction effects are important to model total transmission reflection also include waveguide description corrugated horn. For optical beams same technique is equally applicable, but less severe this framework. This flexible has many applications laser optics far-infrared submillimeter-instrumentation analysis, it possible incorporate both free space whole system. To conclude verify accuracy technique, experimental measurements taken at 94GHz compared with theoretical predictions cavity polyethylene sheets between source detector antennas.