Synchrotron-based micro computed tomography investigation of the implant-abutment fatigue-induced microgap changes.

摘要: Abstract Objective This study evaluates the effect of dynamic-loading on microgap IAC when different supratructure heights are applied. Materials and methods: Forty-eight dental implants (24 each butt-joint (H) internal-conical connections (C)) were tested in this study. Each group was further divided into three groups (n = 8) according to applied suprastructure height (H1, C1: 10 mm, H2, C2: 14 mm H3, C3: 18 mm). All specimens subjected cyclic loading a chewing-simulator with load 98 N for 5 × 106 chewing cycles. The at inspected before after loading, using synchrotron-based micro computed tomography (SRμCT) light microscopy (LM). Results: SRμCT revealed an internal range between 0.26 μm 0.5 μm C, whereas H exhibited 0.47 μm prior loading. After simulation, smaller size all detected ranging from 0.11 μm (group C: 0.11μm–0.26 μm; H: 0.21μm–0.25 μm). LM investigation showed mean values outer junction 5.8 μm 11.3 μm 3.9 μm 7.2 μm vertical intrusion displacement abutment. Conclusion: Regardless crown height, abutment implant systematically decreased both connections.