A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer

作者: L. G. Schulz

DOI: 10.1063/1.1698268

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摘要: … is described for determining pole figures of flat samples with a Geiger counter x-:ay spectrom… the third is placed in fr?nt of the counter. A mathematical analysIs of the optical elements of …

参考文章(2)
John T. Norton, A Technique for Quantitative Determination of Texture of Sheet Metals Journal of Applied Physics. ,vol. 19, pp. 1176- 1178 ,(1948) , 10.1063/1.1715039
B. F. Decker, E. T. Asp, D. Harker, Preferred Orientation Determination Using a Geiger Counter X‐Ray Diffraction Goniometer Journal of Applied Physics. ,vol. 19, pp. 388- 392 ,(1948) , 10.1063/1.1715077