Surface differential reflectivity for studying surface state optical transitions—a review
作者： A Cricenti
DOI: 10.1088/0953-8984/16/39/001
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摘要: In this paper we present an overview of the method surface differential reflectivity (SDR) for study semiconductor surfaces. We will describe principles technique and experimental apparatus together with some theoretical considerations concerning connection SDR microscopic properties surface. particular, analysis is done in frame a macroscopic three layers model which media involved (vacuum, substrate) are assumed to have definite anisotropic dielectric functions. A few results, indicative potential technique, be shown.
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