Understanding tip-enhanced Raman spectroscopy by multiphysics finite element simulations
作者： Vladimir Kolchuzhin , Jan Mehner , Evgeniya Sheremet , Bhattacharya Kunal , Raul D. Rodriguez
DOI: 10.1109/EUROSIME.2015.7103161
关键词:
摘要: This article deals with the models development and FE simulations for mechanical properties of all-metal AFM-TERS tips electric field enhancement between tip sample. The most important aspects in simulations, parameters necessary creating models, obtained results are presented discussed article.
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