How to Count Patents and Value Intellectual Property: The Uses of Patent Renewal and Application Data

作者: Jean O. Lanjouw , Ariel Pakes , Jonathan Putnam

DOI: 10.1111/1467-6451.00081

关键词:

摘要: Patent counts are very imperfect measures of innovative output. This paper discusses how additional data-the number years a patent is renewed and the countries in which protection for same invention sought--can be used to improve on studies that require measure extent innovation. Simple weighting schemes proposed, may remove half noise as We describe models application renewal processes whose parameter estimates can assess value proprietary rights created by laws. illustrate their use with would vary under alternative legal rules fees international flows returns from system. Recent progress development databases has increased potential this type analysis.

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