Scanning Probe Techniques: MFM and SP‐STM
作者： Alexander Schwarz , Matthias Bode , Roland Wiesendanger
DOI: 10.1002/9780470022184.HMM319
关键词:
摘要: This chapter surveys the basic concepts, experimental conditions, modes of operation, tip preparation, and contrast mechanisms two magnetic-sensitive scanning probe techniques, that is, magnetic force microscopy (MFM) spin-polarized tunneling (SP-STM). The strength limitations these imaging techniques are exemplified by presenting results obtained on numerous sample systems including hard disks, epitaxial surfaces, nanoparticles at various temperatures external fields. Keywords: surface magnetism; nanomagnetism; magnetic domain imaging; domain wall structure; spin mapping atomic scale; magnetic force; magnetic exchange microscopy; spin-polarized microscopy; magnetic data storage; magnetic vortices; magnetization reversal
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