Copper phthalocyanine‐titanium oxide multilayers

摘要: Copper phthalocyanine‐titanium oxide (CuPc‐TiOx) heteromultilayers have been fabricated by evaporation and reactive techniques, their structural optoelectronic properties investigated. X‐ray diffraction secondary ion mass spectroscopy confirm the formation of a clear alternating layered structure on nanometer scale. An interface roughness 7 A has achieved for multilayer with an artificial period 40 A. Atomic force microscopy at scratched edges multilayers reveal double‐layered structures TiOx CuPc, indicating existence two kinds interface. Transverse photoconduction measurements samples deposited SnO2‐coated glass, using back electrode Al, show occurrence electron transfer from CuPc to interfaces.