Structural imaging of β-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopy
作者： Zaoli Zhang , Ute Kaiser
DOI: 10.1016/J.ULTRAMIC.2009.04.004
关键词:
摘要: Abstract Modern transmission electron microscopes (TEM) allow utilizing the spherical aberration coefficient as an additional free parameter for optimizing resolution and contrast. By tuning of objective lens, isolated nitrogen atom columns well Si–N dumbbells within six-membered ring were imaged in β-Si 3 N 4 along [0 0 0 1] [0 0 0 1¯] projections with a dumbbell spacing 0.94 A white This has been obtained negative or positive coefficient. We clarify contrast details by means extended image calculations. A simple procedure shown pure phase imaging, which is restricted to linear imaging conditions.
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