Processing system for detection and the classification of flaws on metallic surfaces

作者: Nicholas Yaroshuk , Miklos Sarkozi , Robert C. Miller , Paul G. Kennedy

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摘要: This invention is a system of automatically classifying defects both for sorting defective products (metallic surfaces, especially tube surfaces) as to the reworking operation required correcting defect, and defect preceding manufacturing which most probable cause that sending signal provide adjustments minimize future defects. The uses source electromagnetic radiation (typically laser beam scanned across surface) at least two sensors (adjusted such reflected from defect-free surface principally received by one but there measured amount in other sensor). An average principal sensor developed function scan position. Threshold circuitry detects when ratio varies predetermined amount. Special used detect essentially simultaneous occurrence different preselected combinations variations identify type defect.