作者: R.A.L. Jones , R.J. Lehnert , H. Schonherr , J. Vancso
DOI: 10.1016/S0032-3861(98)00249-3
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摘要: Deuterated and protonated end-functionalized polystyrenes of low high molecular weight were grafted onto silicon substrates by solution-spincasting, followed annealing removal ungrafted chains. The remaining layers characterised spectroscopic ellipsometry atomic force microscopy. effect a variation the initial film thickness, temperature time on resulting was investigated. It found that only thickness deuteration had marked layer morphology thickness. Further improvement in reproducibility is needed to achieve real process control.