作者: Maxime Lebugle , Marianne Liebi , Klaus Wakonig , Vitaliy A Guzenko , Mirko Holler
DOI: 10.1364/OE.25.021145
关键词:
摘要: High-efficiency microfocusing of multi-keV X-rays at synchrotron sources is highly profitable for spatially resolved structural analysis many kinds. Because radiation from typically elongated along the horizontal dimension, generating a microbeam that isotropic in size requires carefully designed optics system. Here we report on using combination horizontally tunable slit downstream undulator source with elliptical diffractive Fresnel zone plates. We demonstrate arrangement context small-angle X-ray scattering experiments, obtaining 2.2 μm × 1.8 (X Y) flux 1.2 1010 photons/s an energy 11.2 keV sample position.