Dynamic instability analysis of U-shaped electromechanical nano-sensor operated in vdW regime

摘要: U-shape nanoelectromechanical systems (NEMS) are potential for developing miniature sensors. While the electro-mechanical performance of conventional beam-type NEMS has been exclusively addressed in literature, few works have considered this phenomenon U-shaped systems. Herein, static and dynamic pull-in instability is investigated under presence vdW force. Based on recently developed consistent couple stress theory (CCST), size-dependent constitutive equation derived. Two types beam cross-sections including rectangular circular geometries considered. The nonlinear equations solved by employing Ray-leigh-Ritz solution method. model validated comparison with results presented literature. effect various parameters parameters, phase plans stability threshold system discussed. obtained reveal that attraction decreases voltage while size dependency enhances voltage. On other hand, demonstrates characteristics tip-plate can change significantly.