Focussed ion beam serial sectioning and imaging of monolithic materials for 3D reconstruction and morphological parameter evaluation

摘要: A new characterisation method, based on the utilisation of focussed ion beam-scanning electron microscopy (FIB-SEM), has been employed for evaluation morphological parameters in porous monolithic materials. Sample FIB serial sectioning, SEM imaging and image processing techniques were used to extract pore boundaries reconstruct 3D structure carbon silica-based monoliths. Since silica is a non-conducting material, commercial monolith modified with activated was instead minimise charge build-up during sectioning. This work therefore presents novel methodology that can be successfully reconstruction materials which are or made conductive through surface bulk modification. Furthermore, reconstructions calculation macroporosity, good agreement porosity values obtained by mercury intrusion porosimetry (MIP).