Heating in material testing apparatus

作者: James Frank Smith , Nicholas John Pickford

DOI:

关键词:

摘要: A method of controlling the temperature a probe in materials testing apparatus, and apparatus operating by that are disclosed. The includes heating elements can supplied with energy to apply heat probe. has phase. In phase, closed-loop control is used supply target temperature. When reached temperature, average power being determined. Then, maintenance continuous constant source at substantially equal determined maintain

参考文章(19)
Randall C. Veitch, Thermal profile system ,(1986)
John A. Chidzey, John T. Huberts, Open loop control for spectrophotometer atomizer furnace ,(1985)
John Frederick Woolley, Graphite tube furnace ,(1974)
James Frank Smith, Surface testing equipment and method ,(1999)
Nicolas Zadno, Erik Thai, Denise Demarais, Mark Deem, Mark Gelfand, Andrew Wu, Benjamin J Clark, Hanson Gifford, Howard R Levin, Methods and systems for thermally-induced renal neuromodulation ,(2007)
Omar M. Amirana, Sidney D. Fleischman, Russell A. Houser, David K. Swanson, Systems and methods for creating lesions in body tissue using segmented electrode assemblies ,(1996)
Loos-Vollebregt Margaretha T C De, Petrus C Bank, Galan Leo De, Method and apparatus for electrothermal atomization of samples ,(1988)