Investigation of the electrical conduction of thin metal films by scanning electron microscopy
作者： Z. Barkay , B. Dwir , G. Deutscher
DOI: 10.1016/0040-6090(89)90247-2
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摘要: Abstract The conduction of palladium and indium films was investigated in a scanning electron microscope. voltage map the samples revealed conduction-geometry dependence. Ohmic behaviour existed continuous metallic regions capacitor-like discontinuous areas percolating film. A resistor-capacitor model is proposed for metal-insulator samples.
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