A modification of the method for determination of surface fractal dimension and multifractal analysis

摘要: Purpose: In this work modification of the PCM method for determination surface fractal dimension is proposed. Complete reasoning, leading to correct formula Ai(δ) presented. order test modified method, data sets characterised by fractional were generated. Design/methodology/approach: Three different algorithms receive describing surfaces with exploited (two midpoint displacement and Falconer algorithm). Findings: detailed methodology multifractal description, which may be directly applied obtained from AFM microscope, was Research limitations/implications: The geometrical features description coatings in PVD CVD processes. Practical implications: presented Performed calculations proved that new make possible determine parameter more correctly. Differences are especially significant rough surfaces, as what tested using series generated modelling dimension. Proposed can used Originality/value: Fractal analysis gives possibility characterise extent irregularities analysed quantitative way.