作者: R. Delhez , Th. H. de Keijser , E. J. Mittemeijer
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摘要: AbstractX-ray diffraction analysis can be very usefully applied in the field of surface engineering, since a depth few micrometres only is usually probed. This paper provides an overview current X-ray methods for layers. The treatment illustrated by examples taken from recent work on nitrided iron and steels. Distinct ways to characterize effective layer thickness probed are presented. Composition-depth profiles measured accurately tracing lattice parameter (taking into account possible presence stresses) as function below successive sublayer removals. A correction penetration effect required that presented demonstrated. basis determination (macro) stress (the sin2ψ method) indicated. Attention paid strain free spacing (diffraction) elastic constants, concentration-depth profile, ...