摘要: … Electric-field-assisted thermal ionization of trapped charge carriers in electronic semiconductors and insulators was initially described by Frenkel,1 who estimated the effect …
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sci-hub.se 参考文章(5)
J. J. O'Dwyer, Current‐Voltage Characteristics of Dielectric Films Journal of Applied Physics. ,vol. 37, pp. 599- 601 ,(1966) , 10.1063/1.1708222
T. E. Hartman, J. C. Blair, R. Bauer, Electrical Conduction through SiO Films Journal of Applied Physics. ,vol. 37, pp. 2468- 2474 ,(1966) , 10.1063/1.1708838
J. Frenkel, On Pre-Breakdown Phenomena in Insulators and Electronic Semi-Conductors Physical Review. ,vol. 54, pp. 647- 648 ,(1938) , 10.1103/PHYSREV.54.647
I. T. Johansen, Electrical Conductivity in Evaporated Silicon Oxide Films Journal of Applied Physics. ,vol. 37, pp. 499- 507 ,(1966) , 10.1063/1.1708203
John G. Simmons, Poole-Frenkel Effect and Schottky Effect in Metal-Insulator-Metal Systems Physical Review. ,vol. 155, pp. 657- 660 ,(1967) , 10.1103/PHYSREV.155.657