Microstructure and dielectric properties of Ba1−xSrxTiO3 films grown on LaAlO3 substrates

作者: Y. Gim , T. Hudson , Y. Fan , C. Kwon , A. T. Findikoglu

DOI: 10.1063/1.1289272

关键词:

摘要: We report a systematic study of the microstructure and dielectric properties barium strontium titanate, Ba1−xSrxTiO3, films grown by laser ablation on LaAlO3 substrates, where x=0.1–0.9 at an interval 0.1. X-ray diffraction analysis shows that when x 0.4, compared with peak temperatures bulk Ba1−xSrxTiO3. At room temperature, constant tunability are relatively high x⩽0.4 but start to decrease rapidly as increases.

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