作者: Michał Cichomski , Witold Szmaja
DOI: 10.1007/S00339-010-5979-3
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摘要: Polycrystalline cobalt films 100 nm thick were thermally evaporated on oxidized Si(100) substrates. Then 1H, 2H, 2H perfluorodecyltrichlorosilane (FDTS) of various thicknesses, in the range about 2 to 30 nm, grown surfaces by vapor phase deposition (VPD). The modified FDTS investigated using magnetic force microscopy (MFM) and atomic (AFM). MFM observation showed that structure is composed domains with a considerable component magnetization perpendicular film surface. This turn indicates substrates crystallize hexagonal close-packed (HCP) exhibit texture axis formed maze structure. domain width increased from typically 80–120 400–500 increasing thickness nm. AFM imaging revealed presence an agglomerate morphology. agglomerates varied size 30–70 150–300 as was