作者: Yumei Zhang , Wenxue Yu , Fanghui Chen , Mei Liu , Yongsheng Yu
DOI: 10.1007/S00339-012-7122-0
关键词:
摘要: FePt/Ag films were deposited on thermally oxidized Si(100) substrates by magnetron sputtering at room temperature and then the as-deposited annealed 500 ∘C. The microstructure magnetic properties of have been investigated X-ray diffraction vibrating sample magnetometry. results indicate that introduction Ag underlayer promotes an ordering transformation FePt phase due to thermal tensile stress between film. in-plane induced should stretch horizontal lattice parameter FePt; thus, it is helpful for transformation. With increasing thickness, coercivity first increase decrease. When thickness 12 nm, film reach maximum values, respectively. also affects magnetization reversal mechanism.