作者: Andre Van Rynbach , Peter Maunz , Jungsang Kim
DOI: 10.1063/1.4970542
关键词:
摘要: We report a demonstration of surface ion trap fabricated directly on highly reflective mirror surface, which includes secondary set radio frequency (RF) electrodes allowing for translation the quadrupole RF null location. introduce position-dependent photon scattering rate $^{174}$Yb$^+$ in direction perpendicular to using standing wave retroreflected light off below trap. Using this setup, we demonstrate capability fine-tuning location with nanometer scale precision and characterize charging effects dielectric upon exposure ultra-violet light.