On the Discrepancies in Defect Studies in Bi
作者： I. Lemahieu , L. Dorikens-Vanpraet , D. Segers , M. Dorikens , P. Moser
关键词:
摘要: Positron annihilation measurements are performed on low temperature electron irradiated pure bismuth. Different stages during recovery found. These compared with literature results the annealing of The discrepancies in appearing different discussed, as is positron trapping defects bismuth. Des mesures d'annihilation des positrons ont ete faites sur echantillons du bismuth pur irradie aux electrons. Plusieurs de recuit mesures. Ces sont compares avec les resultats la litterature le pur. Les contradictions apparentes concernant (a position differents discutees, ainsi que piegage dans defauts
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